Brian Strohmeier, PhD

Dr. Strohmeier has more than twenty nine years of research experience in the practical application of surface and microscopic analytical techniques for industrial product/process development, industrial problem-solving, and materials characterization. His technical expertise includes: X-ray Photoelectron Spectroscopy (XPS, also known as Electron Spectroscopy for Chemical Analysis or ESCA), Auger Electron Spectroscopy (AES), Secondary Ion Mass Spectrometry (SIMS), Scanning Electron Microscopy/Energy Dispersive X-ray Spectroscopy (SEM/EDS), Transmission Electron Microscopy (TEM), and other related analytical and spectroscopic techniques. His technical experience includes the study of adhesion, corrosion, oxidation, and wetting phenomena; chemical and plasma modification of material surfaces; and the surface characterization of metals, oxides, minerals, glass and fiberglass, ceramics, polymers, vacuum-deposited thin films, organic coatings, and heterogeneous catalysts. He also has served as an expert trial witness for litigation involving surface analytical techniques.